A06.1 - Learning from Failure: Negative and Null Results in Microscopy

Session Chair(s)

• DC

  Dave Cullen

Presentations:

• 1:30 PM – 2:00 PM US CST

  Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope
  

  Presenting Author: Masashi WATANABE – Dept. of Materials Science and Engineering Lehigh University

  Co-Author: Giulio Guzzinati – CEOS GmbH

  Co-Author: Volker Gerheim – CEOS GmbH

  Co-Author: Martin Linck – CEOS GmbH

  Co-Author: Heiko Müller – CEOS GmbH

  Co-Author: Max Haider – CEOS GmbH

  Co-Author: Thomas Hoffman – JEOL USA

  Co-Author: Thomas Isabell – JEOL USA

  Co-Author: Naoki Shimura – JEOL USA

  Co-Author: Hidetaka Sawada, Ph.D. (he/him/his) – JEOL USA, Inc.
• 2:00 PM – 2:15 PM US CST

  Can We Analyze the Solution Behavior of My Particles with Your cryo-FIB?: Adventures and Lessons Learned
  

  Presenting Author: Jamie Ford, PhD (he/him/his) – University of Pennsylvania
• 2:15 PM – 2:30 PM US CST

  Failure to Fail: Recreating Real-life Nanoparticle Degradation in Model Environments
  

  Presenting Author: Haoran Yu, Ph.D – Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

  Co-Author: Michael J. Zachman, PhD – Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

  Co-Author: David A. Cullen, Ph.D – Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
• 2:30 PM – 3:00 PM US CST

  Mistakes and pitfalls in in situ TEM studies
  

  Presenting Author: Myung-Geun Han (he/him/his) – Brookhaven National Laboratory

  Co-Author: Yimei Zhu (he/him/his) – Brookhaven National Laboratory