Oxford Instruments | Backscattered Electron and X-ray Imaging (BEX)
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
point electronic GmbH | Custom scan patterns with external TEM scan controller (DISS6)
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Protochips Inc. | Machine vision-based in situ TEM for studying energy materials
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
SEC Co., Ltd | Raman, CL, EDS and EBIC on a tabletop SEM
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
TESCAN | Accelerating and Advancing Nanoscale Characterization of Materials by seamless 4D-STEM workflows using the new TESCAN TENSOR analytical STEM microscope