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29
Quantification of Potential Drops Across Semiconductor Heterointerfaces Using 4D-STEM

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209
Quantification of Si, Al, Ti and O composition in Si/Al oxide based synaptic resistor circuits

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17
Quantitative analysis of transition metal oxides at low accelerating voltage with the Soft X-ray Emission Spectrometer

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116
Quantitative Imaging using an Automated in-operando micro-CT Workflow: Tracking the Drying and Related Shape-changes of Silica Aerogels

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127
Quickly switchable angular and spatially resolved Cs-corrected STEM

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