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406
Fabrication of Atomic-scale Defect Structures within 2D Materials through Automated Electron Beam Control

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378
Fast Correction of Astigmatism and Focus in the Scanning Electron Microscope using a GPU-accelerated PC

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349
Fluorescence-guided cryo-lift-out using an integrated fluorescence light microscope and an optimized sample-needle attachment procedure

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225
Fourier-Ring Correlation Resolution for Time-Resolved Measurement in Charged Particle Microscopy

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