Skip to main content
M&M 2023 Meeting (Microscopy & Microanalysis) Main banner
Final Program


Icon Legend
This session is not in your schedule.
This session is in your schedule. Click again to remove it.
Back

Analytical Sciences Symposia

Category: Featured Symposium

A08.P1 - Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences

(135) Three-in-one Plan-view TEM Sample Preparation for 3D NAND Abstract

Tuesday, July 25, 2023
3:00 PM – 5:00 PM US CST
Location: Exhibit Hall

    Presenting Author(s)

  • DG

    Drew Goettler, Ph.D

    Applications Engineer
    Applied Materials
    Hillsboro, Oregon, United States

    • Co-Author(s)

  • MZ

    Ming Zhang

    Applied Materials
    Hillsboro, Oregon, United States