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Analytical Sciences Symposia

Category: Featured Symposium

A05.P1 - Advanced Measurement Techniques in (S)TEM-EELS

(215) Combine 4D STEM and EELS Using a Fast Pixelated Direct Detector with Center Hole

Wednesday, July 26, 2023

3:00 PM – 5:00 PM US CST

Location: Exhibit Hall

Presenting Author(s)

BE

Björn Eckert

PNDetector GmbH, Germany
SA

Stefan Aschauer

PNDetector GmbH, Germany
Emma Hedley

DPhil Student
University of Oxford, Dept. of Materials
University of Oxford, United Kingdom
PN

Peter D. Nellist

Professor
University of Oxford, United States
PM

Petra Majewski

PNDetector GmbH, Germany
Lothar Strueder

CEO of PNSensor, Prof. at Univ. of Siegen, fellow of the MAS
PNSensor GmbH
Univ. of Siegen
Munich, Bayern, Germany
HS

Heike Soltau

PNDetector GmbH, Germany