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Final Program


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Cross-Cutting Symposia

Category: Featured Symposium

C01.P1 - Machine Intelligence in Action: Delivering Resilient, Sustainable, and Reconfigurable Microscope Ecosystems

(380) Improving Automated TEM Metrology based on AI Few Shot Learning-DRAM Word Line Patterning Layer and Logic NMOS eSD Seam

Thursday, July 27, 2023
10:00 AM – 12:00 PM US CST
Location: Exhibit Hall