Research Associate
Corning Research and Development Corporation, United States
Dr. Christine Mahoney is an analytical chemist, polymer chemistry expert and surface analyst, who has gained notoriety in the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to the analysis of polymers and organic materials. She received her bachelor’s degree in chemistry in 1997 from the State University of New York at Potsdam. After which she obtained a Ph.D. in analytical chemistry at State University of New York at Buffalo under the advisement of Joseph Gardella. After graduate school, Christine joined the National Institute of Standards and Technology (NIST) as an NRC post-doctoral fellow in 2003, where she pioneered the field of 3-D ToF-SIMS analysis of polymeric materials. After her tenure at NIST, Christine worked at the Pacific Northwest National Laboratory (PNNL) and the Naval Research Laboratory (NRL), where her focus shifted towards forensics applications of surface analytical tools. Christine currently leads a team of ToF-SIMS scientists in the field of surface analysis of glass and their associated coatings at Corning Research and Development Corporation. Dr. Mahoney currently has >50 publications, including a seminal work in Mass Spectrometry Reviews, cited over 330 times to date, and a book in the Wiley Series on Mass Spectrometry entitled “Cluster Secondary Ion Mass Spectrometry, Principles and Applications”. Christine has also served on several international committees, including ASTM, the Applied Surface Science Division (ASSD) at AVS, and the scientific and program committees for the International SIMS conferences. Currently she is helping to launch a non-profit North American SIMS Board, which will regularly host SIMS workshops in the US.
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Tuesday, July 25, 2023
9:00 AM – 9:30 AM US CST