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Tweets by M&M 2023 Meeting (Microscopy & Microanalysis)
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Richard Hailstone
Rochester Institute of Technology
Poster(s):
(229) Probe Aberration Correction in Scanning Electron Microscopy using Artificial Neural Networks
Wednesday, July 26, 2023
3:00 PM – 5:00 PM
US CST
(36) Electron Vortex Beam and Probe Phase in Scanning Electron Microscopy
Monday, July 24, 2023
3:00 PM – 5:00 PM
US CST
(38) Need for Wavefront Sensing in Scanning Electron Microscopy
Monday, July 24, 2023
3:00 PM – 5:00 PM
US CST
