CEO, Co-founder
NenoVision s. r. o., 612 00 Brno, CZ, Czech Republic
Jan Neuman studied nanotechnology, surface science, and engineering at the Brno University of Technology in the Czech Republic and finished his Ph.D. in 2014. He started his professional career as a researcher in the field of nanostructure characterization at the Institute of Physical Engineering where he was actively involved in the production and development of piezo-motors and probe microscopes. Between 2010 and 2014, he led the development team of the atomic force microscope within the AMISPEC project. The results of this project were successfully commercialized by NenoVision. In 2015 he co-founded NenoVision s.r.o., where he works as a chief executive officer until the present. NenoVision is the first Spin-off of CEITEC BUT aiming to develop, manufacture and sell atomic force microscopes. The first successful product, LiteScope™, is a unique atomic force microscope designed for easy integration into a scanning electron microscope. LiteScope represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life science. It is equipped with patented CPEM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.