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Final Program


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Vendor Tutorials

Wednesday, July 26, 2023
5:45 PM – 6:45 PM US CST
Location: Exhibit Hall

    Presentations:

    • 5:45 PM – 6:45 PM US CST
      3D-Micromac AG | microPREP PRO: New Vistas for Failure Analysis and Sample Preparation
    • 5:45 PM – 6:45 PM US CST
      Abberior Instruments America | Super-resolution, from the Inventors of STED
    • 5:45 PM – 6:45 PM US CST
      Attocube Systems Inc. | Nanoscale Optical Analysis Methods: AFM-IR, s-SNOM, nano-FTIR
    • 5:45 PM – 6:45 PM US CST
      Barnett Technical Services | Microplastics Sampling and Detection
    • 5:45 PM – 6:45 PM US CST
      DECTRIS | 4D STEM in practice with DECTRIS ARINA
    • 5:45 PM – 6:45 PM US CST
      Delmic B.V. | Live demonstration of METEOR: Delmic's integrated cryo-FLM system
    • 5:45 PM – 6:45 PM US CST
      GATAN/EDAX | From electrons to images: A crash course in EM camera technology
    • 5:45 PM – 6:45 PM US CST
      Graphene liquid cells and their newest applications in TEM
    • 5:45 PM – 6:45 PM US CST
      Hitachi High-Tech America, Inc. | Optimization of Cryo-TEM Screening Utilizing Hitachi’s 120 kV HT7800 TEM
    • 5:45 PM – 6:45 PM US CST
      Hummingbird Scientific | Recent advances in in-situ microscopy: multi-model and multi-stimuli in-situ microscopy
    • 5:45 PM – 6:45 PM US CST
      JEOL USA | Special guest speaker – Advanced Developments for TEM
    • 5:45 PM – 6:45 PM US CST
      Linkam Scientific Instruments | CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples
    • 5:45 PM – 6:45 PM US CST
      NenoVision | LiteScope - In-Situ Correlative Microscopy
    • 5:45 PM – 6:45 PM US CST
      Nion Company | Nion Swift - A tool for Data Acquisition, Analysis, and Advanced Microscopy
    • 5:45 PM – 6:45 PM US CST
      point electronic GmbH | Novel electrode-based BSE detector for in-situ microscopy
    • 5:45 PM – 6:45 PM US CST
      Quantifoil and SPT Labtech | An Introduction to HexAuFoil next-generation cryoEM grids
    • 5:45 PM – 6:45 PM US CST
      SiriusXT | Biological Soft X-ray Tomography
    • 5:45 PM – 6:45 PM US CST
      TESCAN | Streamlining Materials Science Sample Characterization with Highly Automated FIB-SEM TEM Sample Preparation for analysis in TESCAN TENSOR 4D-STEM