A14.1 - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Sponsored By 

Session Chair(s)

• 

  Xiao-Ying Yu (she/her/hers)

  Distinguished Scientist
  Oak Ridge National Laboratory
  Oak Ridge National Laboratory
  Oak Ridge, Tennessee, United States

Presentations:

• 1:30 PM – 2:00 PM US CST

  Multidimensional Chemical Imaging of Polyolefin Dispersion Can Coatings Using Time-of-Flight Secondary Ion Mass Spectrometry with Gas Cluster Ion Beam Sputtering
  

  Presenting Author: Paul Vlasak, Ph.D. – The Dow Chemical Company

  Co-Author: Ray Drumright – The Dow Chemical Company

  Co-Author: Joseph Harris – The Dow Chemical Company

  Co-Author: Pacholski Michaeleen – The Dow Chemical Company

  Co-Author: Hanze Ying – The Dow Chemical Company
• 2:00 PM – 2:30 PM US CST

  Fundamentals and Applications of Secondary Ion Mass Spectrometry
  

  Presenting Author: Jerry L. Hunter, Jr., Ph. D. (he/him/his) – University of Wisconsin - Madison
• 2:30 PM – 3:00 PM US CST

  CANCELLED: Hybrid SIMS: Secondary Ion Mass Spectrometry Imaging with High Mass Resolving Power
  

  Presenting Author: Felix Kollmer (he/him/his) – IONTOF GmbH

  Co-Author: Alexander Pirkl (he/him/his) – IONTOF GmbH

  Co-Author: Julia Zakel (she/her/hers) – IONTOF GmbH

  Co-Author: Henrik Arlinghaus (he/him/his) – IONTOF GmbH

  Co-Author: Ewald Niehuis (he/him/his) – IONTOF GmbH