C03.7 - Correlative and Multimodal Microscopy and Analysis

Sponsored By 

Session Chair(s)

• 

  Xiao-Ying Yu (she/her/hers)

  Distinguished Scientist
  Oak Ridge National Laboratory
  Oak Ridge National Laboratory
  Oak Ridge, Tennessee, United States

Presentations:

• 1:30 PM – 1:45 PM US CST

  Correlative Microscopy Applied to Battery Research
  

  Presenting Author: Ute Schmidt (she/her/hers) – WITec GmbH

  Co-Author: Niklas Biere – WITec GmbH

  Co-Author: Florian Johann – Asylum Research

  Co-Author: Joshua N. Lea (he/him/his) – Oxford Instruments NanoAnalysis

  Co-Author: Stefan Kreissel – WITec GmbH

  Co-Author: Dominik Zimmer – Oxford Instruments GmbH
• 1:45 PM – 2:00 PM US CST

  Correlative nanoscopy and spectroscopy at nanoscale
  

  Presenting Author: Artem Danilov (he/him/his) – Attocube Systems Inc

  Co-Author: Tobias Gokus, Dr. – attocube systems AG

  Co-Author: Paul Suman, Dr. – attocube systems Inc

  Co-Author: Adrian Cernescu – attocube systems AG

  Co-Author: Andreas J. Huber, Dr. – Attocube systems AG
• 2:00 PM – 2:15 PM US CST

  Probing Dielectric Breakdown in Single Crystal Hexagonal Boron Nitride
  

  Presenting Author: Alok Ranjan, PhD – Chalmers University of Technology

  Co-Author: Andrew Yankovich, Ph.D. – Chalmers University of Technology

  Co-Author: Kenji Watanabe – National Institute for Materials Science

  Co-Author: Takashi Taniguchi – National Institute for Materials Science

  Co-Author: Eva Olsson, Ph.D. – Chalmers University of Technology
• 2:15 PM – 2:30 PM US CST

  Exploring the dynamics of grain growth in thin specimens using Laboratory Diffraction Contrast Tomography
  

  Presenting Author: Varun Venkatesh – University of Michigan

  Co-Author: Marcel Chlupsa – University of Michigan

  Co-Author: Hrishikesh Bale – ZEISS Research Microscopy Solutions

  Co-Author: Jette Oddershede – Xnovo Technologies ApS

  Co-Author: Ashwin Shahani – University of Michigan
• 2:30 PM – 2:45 PM US CST

  Spectral CT in the World of Electronics: Moving Toward Failure Free Devices
  

  Presenting Author: Jan Dewanckele – TESCAN XRE

  Co-Author: Marijn Boone – TESCAN XRE

  Co-Author: Denis Van Loo – TESCAN XRE

  Co-Author: Wesley De Boever – TESCAN XRE
• 2:45 PM – 3:00 PM US CST

  Multimodal Analysis of Concrete and Cementitious Materials
  

  Presenting Author: Joshua N. Lea (he/him/his) – Oxford Instruments NanoAnalysis

  Co-Author: Daniel Haspel, PhD (he/him/his) – Oxford Instruments NanoAnalysis

  Co-Author: Ana Blanco-Alvarez – Loughborough University

  Co-Author: John Kolawole – Loughborough University

  Co-Author: Liam Whyte – Loughborough University

  Co-Author: Matt Hiscock – Oxford Instruments NanoAnalysis