A08.3 - Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences

Sponsored By 

Session Chair(s)

• MT

  Matthew Thorseth

  Dow
  Midland, Michigan, United States

Presentations:

• 10:30 AM – 11:00 AM US CST

  Application of FIB-ToF-SIMS to the search for and characterisation of enriched uranium particles
  

  Presenting Author: William Rickard – John de Laeter Centre, Curtin university

  Co-Author: Xiao Sun – John de Laeter Centre, Curtin university

  Co-Author: Matvei Aleshin – Centre for Microscopy, Characterisation and Analysis, UWA

  Co-Author: Laure Martin – Centre for Microscopy, Characterisation and Analysis, UWA

  Co-Author: Masturina Kracica – Australian Nuclear Science and Technology Organisation

  Co-Author: Daniel Oldfield – Australian Nuclear Science and Technology Organisation

  Co-Author: Denis Fougerouse (he/him/his) – Geoscience Atom Probe Facility, John de Laeter Centre, School of Earth and Planetary Sciences, Curtin University

  Co-Author: Steven Reddy – School of Earth and Planetary Sciences, Curtin University

  Co-Author: David Saxey – John de Laeter Centre, Curtin University
• 11:00 AM – 11:15 AM US CST

  5D-TOF-STIM Imaging with a Low-Energy He+ Focused Ion Beam
  

  Presenting Author: Dustin Andersen – Luxembourg Institute of Science and Technology

  Co-Author: Michael Mousley – Luxembourg Institute of Science and Technology

  Co-Author: Tom Wirtz (he/him/his) – Luxembourg Institute of Science and Technology

  Co-Author: Santhana Eswara – Luxembourg Institute of Science and Technology
• 11:15 AM – 11:30 AM US CST

  Focused Beams for use in EBSD and TKD
  

  Presenting Author: Bartlomiej Winiarski, Ph.D. – Thermo Fisher Scientific
• 11:30 AM – 11:45 AM US CST

  Focused Ion Beam Nano-thermometry
  

  Presenting Author: Julia Deitz – Sandia National Laboratory

  Co-Author: Tim Ruggles – Sandia National Laboratories

  Co-Author: Samantha Rosenberg – Sandia National Laboratory

  Co-Author: Mila Lam – Sandia National Laboratory

  Co-Author: Luis Jauregui – Sandia National Laboratories

  Co-Author: John N. Williard – Sandia National Laboratory

  Co-Author: Daniel Perry – Sandia National Laboratory

  Co-Author: Joe Boro – Sandia National Laboratory

  Co-Author: Wyatt Hodges – Sandia National Laboratory
• 11:45 AM – 12:00 PM US CST

  GaBiLi - A novel Focused Ion Beam (FIB) source for ion microscopy and related workflows for 3D tomography with a top-down FIB from Liquid Metal Alloy Ion Sources (LMAIS).
  

  Presenting Author: Torsten Richter – Raith GmbH

  Co-Author: Achim Nadzeyka – Raith GmbH

  Co-Author: Fabian Meyer – Raith GmbH

  Co-Author: Paul Mazarov – Raith GmbH