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A07.4 - In Memoriam of David Joy: Scanning Electron and Ion Microscopy

Tuesday, July 25, 2023
1:30 PM – 3:00 PM US CST
Location: 200D

    Session Chair(s)

  • DN

    Dale Newbury, Ph.D.

    NIST Fellow
    Materials Measurement Science Division
    National Institute of Standards and Technology
    Gaithersburg, Maryland, United States

Presentations:

  • 1:30 PM – 2:00 PM US CST
    Contributions and legacy of David C. Joy to Monte Carlo simulations in electron and ion microscopy

    Presenting Author: Hendrix Demers, Ph.D (he/him/his) – Hydro-Québec

  • 2:00 PM – 2:30 PM US CST
    David Joy’s Role in Physical Data and Models for Microanalysis

    Presenting Author: Nicholas Ritchie, PhD (he/him/his) – National Institute of Standards and Technology

    Co-Author: Dale Newbury, Ph.D. (he/him/his) – National Institute of Standards and Technology

  • 2:30 PM – 3:00 PM US CST
    How David C. Joy contributed to my research in Electron Microscopy

    Presenting Author: Raynald Gauvin – McGill University