A07.5 - In Memoriam of David Joy: Scanning Electron and Ion Microscopy

Session Chair(s)

• RG

  Raynald Gauvin, Ph.D

  Professor
  Materials Engineering
  McGill University
  Montreal, Quebec, Canada
• DN

  Dale Newbury, Ph.D.

  NIST Fellow
  Materials Measurement Science Division
  National Institute of Standards and Technology
  Gaithersburg, Maryland, United States

Presentations:

• 8:30 AM – 9:00 AM US CST

  In the Beginning – A Look at the Origins of Quantitative Electron Microprobe Analysis
  

  Presenting Author: Eric Lifshin, N/A, Ph.D. – SUNY Polytechnic Institute
• 9:00 AM – 9:15 AM US CST

  Factors affecting martensite tetragonality during EBSD analysis
  

  Presenting Author: Grzegorz Cios (he/him/his) – AGH-UST

  Co-Author: Aimo Winkelmann – ST Development GmbH

  Co-Author: Gert Nolze – BAM Berlin

  Co-Author: Tomasz Tokarski – AGH-UST

  Co-Author: Marta Gajewska – AGH-UST

  Co-Author: Łukasz Rychłowski – AGH-UST

  Co-Author: Piotr Bała – AGH-UST
• 9:15 AM – 9:30 AM US CST

  PyEBSDIndex: Indexing Electron Backscattered Diffraction Patterns on the GPU
  

  Presenting Author: David J. Rowenhorst, Ph. D (he/him/his) – US Naval Research Laboratory

  Co-Author: Patrick Callahan, Ph.D – US Naval Research Laboratory

  Co-Author: Håkon Wiik Ånes – Norwegian University of Science and Technology
• 9:30 AM – 9:45 AM US CST

  Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!
  

  Presenting Author: Dale Newbury, Ph.D. (he/him/his) – National Institute of Standards and Technology

  Co-Author: Nicholas Ritchie, PhD (he/him/his) – National Institute of Standards and Technology
• 9:45 AM – 10:00 AM US CST

  Non-Local Means Denoising of EDS Spectra for Rapid Composition Mapping in a Nickel Aluminum Bronze
  

  Presenting Author: Patrick Callahan, Ph.D – US Naval Research Laboratory

  Co-Author: David J. Rowenhorst, Ph. D (he/him/his) – US Naval Research Laboratory

  Co-Author: Dillon Watring, Ph.D – US Naval Research Laboratory