A13.3 - Computational Advances in Electron Microscopy

Session Chair(s)

• JA

  Joshua Agar (he/him/his)

  Drexel University
  Center Valley, Pennsylvania, United States

Presentations:

• 1:30 PM – 2:00 PM US CST

  Data Acquisition and Control of Electron Microscopes
  

  Presenting Author: Chris E. Meyer (he/him/his) – Nion Company

  Co-Author: Niklas Dellby – Nion Co.

  Co-Author: Tracy Lovejoy – Nion Co.

  Co-Author: Benedikt Haas – Humboldt-Universität zu Berlin

  Co-Author: Gwyn Skone – Nion Company

  Co-Author: Benjamin Plotkin-Swing – Nion Co.

  Co-Author: Andreas Mittelberger – Nion Co.

  Co-Author: Ondrej L. Krivanek – Nion Co.
• 2:00 PM – 2:15 PM US CST

  Deep learning approach for high-accuracy electron counting of direct electron detectors at increased electron dose
  

  Presenting Author: Jingrui Wei – University of Wisconsin Madison

  Co-Author: Kalani Moore – Direct Electron L.P.

  Co-Author: Benjamin Bammes, PhD – Direct Electron L.P.

  Co-Author: Barnaby Levin – Direct Electron L.P.
• 2:15 PM – 2:30 PM US CST

  How to Count Electrons with Pixelated Semiconductor Detectors
  

  Presenting Author: Björn Eckert – PNDetector GmbH

  Co-Author: Stefan Aschauer – PNDetector GmbH

  Co-Author: Martin Huth, MH (he/him/his) – PNDetector GmbH

  Co-Author: Petra Majewski – PNDetector GmbH

  Co-Author: Heike Soltau – PNDetector GmbH

  Co-Author: Lothar Strueder – PNSensor GmbH
• 2:30 PM – 3:00 PM US CST

  Observation of Simultaneous Successive Twinning Using Atomic Electron Tomography
  

  Presenting Author: Mary Scott, Ph.D. – University of California - Berkeley

  Co-Author: Philipp Pelz – University of California, Berkeley

  Co-Author: Kate Groschner – University of California, Berkeley

  Co-Author: Alexandra Bruefach – University of California, Berkeley

  Co-Author: Colin Ophus, Ph.D – NCEM, Molecular Foundry, LBNL