P10.3 - Advanced Imaging and Spectroscopy for Sensitive Materials and Interfaces

Sponsored By 

Session Chair(s)

• LZ

  Lin Zhou

Presentations:

• 10:30 AM – 11:00 AM US CST

  Revealing Topological Properties of Materials: The New Characterization Frontier in Electron Microscopy
  

  Presenting Author: Juan Carlos Idrobo – Materials Science & Engineering Department, University of Washington, Seattle, WA, USA.
• 11:00 AM – 11:15 AM US CST

  Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging
  

  Presenting Author: Lopa Bhatt – School of Applied and Engineering Physics, Cornell University

  Co-Author: James Hart – Department of Materials Science and Engineering, Cornell University

  Co-Author: Elisabeth Bianco – Kavli Institute at Cornell

  Co-Author: Judy Cha – Department of Materials Science and Engineering, Cornell University

  Co-Author: Lena Kourkoutis – School of Applied and Engineering Physics, Cornell University
• 11:15 AM – 11:30 AM US CST

  Investigating Qubits in Silicon Carbide Using Multislice Electron Ptychography
  

  Presenting Author: Aaditya M. Bhat (he/him/his) – Massachusetts Institute of Technology

  Co-Author: Colin Gilgenbach – Massachusetts Institute of Technology

  Co-Author: James M. LeBeau – Massachusetts Institute of Technology
• 11:30 AM – 12:00 PM US CST

  Probing Local Phonon Polariton Signals at Edges of Folded Boron Nitride Sheets
  

  Presenting Author: Xingxu Yan, Ph.D – University of California Irvine

  Co-Author: Jie Li – University of California Irvine

  Co-Author: Chaitanya Gadre (he/him/his) – Department of Physics and Astronomy, University of California at Irvine, Irvine, CA, USA.

  Co-Author: Lei Gu – University of California Irvine

  Co-Author: Ruqian Wu – University of California, Irvine

  Co-Author: Xiaoqing Pan – University of California, Irvine