A03.2 - Standards and Reference Materials and their Applications in Quantitative Microanalysis

Session Chair(s)

• 

  Abigail Lindstrom, BS (she/her/hers)

  Research Chemist
  NiST
  Gaithersburg, Maryland, United States
• WN

  Will Nachlas

Presentations:

• 1:30 PM – 2:00 PM US CST

  What is the Best Way to Extract a k-ratio from an EDS Spectrum?
  

  Presenting Author: Nicholas Ritchie, PhD (he/him/his) – National Institute of Standards and Technology
• 2:00 PM – 2:15 PM US CST

  An Optimized Deconvolution Algorithm for Energy-Dispersive X-ray Spectroscopy
  

  Presenting Author: Stephen Seddio, PhD – Thermo Fisher Scientific

  Co-Author: Jakub Klus, Ph.D. – Thermo Fisher Scientific

  Co-Author: David Rohde – Thermo Fisher Scientific

  Co-Author: Petr Hlavenka, Ph.D. – Thermo Fisher Scientific
• 2:15 PM – 2:30 PM US CST

  EDS and WDS Analysis of Ni-Si Samples at Low Acceleration Voltages
  

  Presenting Author: Ralf Terborg – Bruker Nano GmbH

  Co-Author: Silvia Richter – Central Facility for Electron Microscopy, RWTH Aachen
• 2:30 PM – 3:00 PM US CST

  Methods and Reference Materials used to Calibrate PIXL, the Mars 2020 In Situ XRF Spectrometer
  

  Presenting Author: Chris Heirwegh (he/him/his) – Jet Propulsion Laboratory, California Institute of Technology