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ViewAttendees 4

A07.1 - In Memoriam of David Joy: Scanning Electron and Ion Microscopy

Monday, July 24, 2023
1:30 PM – 3:00 PM US CST
Location: 200D

    Session Chair(s)

  • RG

    Raynald Gauvin, Ph.D

    Professor
    Materials Engineering
    McGill University
    Montreal, Quebec, Canada

  • DN

    Dale Newbury, Ph.D.

    NIST Fellow
    Materials Measurement Science Division
    National Institute of Standards and Technology
    Gaithersburg, Maryland, United States

Presentations:

  • 2:00 PM – 2:30 PM US CST
    Atomic-Scale Secondary-Electron Imaging in the STEM and SEM

    Presenting Author: Ray Egerton – University of Alberta

    Co-Author: Sooyeon Hwang – Brookhaven National Laboratory

    Co-Author: Yimei Zhu (he/him/his) – Brookhaven National Laboratory

  • 2:30 PM – 2:45 PM US CST
    Electron Probe Phase using Defocus in Scanning Electron Microscopy

    Presenting Author: Surya Kamal (he/him/his) – Rochester Institute of Technology

    Co-Author: Richard Hailstone – Rochester Institute of Technology