A07.2 - In Memoriam of David Joy: Scanning Electron and Ion Microscopy

Session Chair(s)

• DN

  Dale Newbury, Ph.D.

  NIST Fellow
  Materials Measurement Science Division
  National Institute of Standards and Technology
  Gaithersburg, Maryland, United States

Presentations:

• 8:30 AM – 9:00 AM US CST

  Contributions of David Joy to Electron Microscopy at the NIH (ca. 1980-2020)
  

  Presenting Author: Richard D. Leapman, Ph.D. – National Institutes of Health
• 9:00 AM – 9:30 AM US CST

  Automated SEM Acquisitions and Segmentation with AI
  

  Presenting Author: Sabrina Clusiau – McGill University

  Co-Author: Nicolas Piché, PhD (he/him/his) – Object Research Systems

  Co-Author: Benjamin Provencher – Object Research Systems

  Co-Author: Mike Strauss – McGill University

  Co-Author: Raynald Gauvin – McGill University
• 9:30 AM – 9:45 AM US CST

  David Joy’s Invaluable Contribution to Modern Scanning (Transmission) Electron Microscopy and Analysis
  

  Presenting Author: Nicolas Brodusch, M.Sc (he/him/his) – McGill University

  Co-Author: Raynald Gauvin – McGill University