A06.3 - Learning from Failure: Negative and Null Results in Microscopy

Session Chair(s)

• SV

  Suzy Vitale

  FIB Lab Manager
  Canegie Institution for Science
  Washington DC, District of Columbia, United States

Presentations:

• 10:30 AM – 11:00 AM US CST

  Confessions of a Ptychopath: Detection, Dimensions, Damage and Despair
  

  Presenting Author: Colum M. O'Leary

  Co-Author: Dillan J. Chang – University of California, Los Angeles

  Co-Author: Peter Ercius, PhD (he/him/his) – Lawrence Berkeley National Laboratory

  Co-Author: Peter D. Nellist – University of Oxford

  Co-Author: Angus I. Kirkland – University of Oxford

  Co-Author: Jianwei Miao – University of California, Los Angeles
• 11:00 AM – 11:15 AM US CST

  Barriers to AI-Driven Defect Detection of Microscopy Images in Industrial Nanoelectronics Manufacturing
  

  Presenting Author: Matthew Hauwiller, PhD – Seagate Technology

  Co-Author: Kurt Loken – Seagate Technology

  Co-Author: TJ Klein – Seagate Technology

  Co-Author: Karen Terry – Seagate Technology
• 11:15 AM – 11:30 AM US CST

  Artifact Elimination in Ultrafast Electron Microscopy
  

  Presenting Author: Spencer Reisbick – Brookhaven National Laboratory

  Co-Author: Yimei Zhu (he/him/his) – Brookhaven National Laboratory
• 11:30 AM – 12:00 PM US CST

  Diffuse electron diffraction intensities in concentrated solid solutions do not necessarily come from short-range order
  

  Presenting Author: Mingwei Zhang – Lawrence Berkeley National Laboratory (LBNL, LBL)

  Co-Author: Flynn Walsh – Lawrence Berkeley National Laboratory

  Co-Author: Mark Asta, Ph.D – University of California Berkeley (UCB), Berkeley, CA United States

  Co-Author: Robert Ritchie – Lawrence Berkeley National Laboratory

  Co-Author: Andrew M. Minor, Prof. – University of California, Berkeley