A07.3 - In Memoriam of David Joy: Scanning Electron and Ion Microscopy

Session Chair(s)

• RG

  Raynald Gauvin, Ph.D

  Professor
  Materials Engineering
  McGill University
  Montreal, Quebec, Canada

Presentations:

• 10:30 AM – 11:00 AM US CST

  How Did Low Voltage in the SEM Become the Preferred Route to High Resolution Imaging?
  

  Presenting Author: Joseph R. Michael, PhD. – n/a
• 11:00 AM – 11:30 AM US CST

  Limits of Resolutions in the Scanning Electron Microscope
  

  Presenting Author: Andras E. Vladar, Ph.D. (he/him/his) – NIST

  Co-Author: Kerim T. Arat, Ph.D. (he/him/his) – Quantum Design Inc
• 11:30 AM – 11:45 AM US CST

  High-performance Compact Lens-type Energy Analyzer for an Energy Distribution Measurement of a Schottky Electron Source
  

  Presenting Author: Inyong Park – KRISS

  Co-Author: Ha Rim Lee – KRISS

  Co-Author: Junhyeok Hawang – KRISS

  Co-Author: Takashi Ogawa – KRISS

  Co-Author: Haewon Jung – KRISS

  Co-Author: Daljae Yun – KRISS

  Co-Author: Jisoo Kim – KRISS

  Co-Author: Sangsun Lee – KRISS
• 11:45 AM – 12:00 PM US CST

  Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM
  

  Presenting Author: Zoë Broad (she/her/hers) – University of Liverpool

  Co-Author: Daniel Nicholls – University of Liverpool

  Co-Author: Jack Wells – University of Liverpool

  Co-Author: Amirafshar Moshtaghpour – Rosalind Franklin Institute

  Co-Author: Alex W. Robinson – University of Liverpool

  Co-Author: Robert Masters – Oxford Instruments

  Co-Author: Louise Hughes – Oxford Instruments

  Co-Author: Nigel D. Browning – University of Liverpool