SEM Project Leader
NIST
Gaithersburg, Maryland, United States
Andras E. Vladar, PhD is the leader of the Three-Dimensional Nanometer Metrology Project at the National Institute of Standards and Technology (NIST) USA. He is an expert in scanning electron microscopy and dimensional metrology, one the best-known research scientists and a technical leader of this field. His research interest is in SEM-based sub-10 nm three-dimensional measurements for semiconductor and nanotechnology applications. More here: https://www.nist.gov/people/andras-e-vladar
Disclosure information not submitted.
Limits of Resolutions in the Scanning Electron Microscope
Tuesday, July 25, 2023
11:00 AM – 11:30 AM US CST