Mike Kautzky, Ph.D.

Seagate Technology, United States

Disclosure information not submitted.

Presentation(s):

• Complementary Use of Sensitive Nanoscale and Bulk Techniques to Probe Surface and Subsurface Defects in High Volume Manufacturing

  Tuesday, July 25, 2023
  10:30 AM – 11:00 AM US CST

• SEM Grain Characterization of Metals for Nanoelectronics

  Tuesday, July 25, 2023
  2:30 PM – 2:45 PM US CST