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Jonathan Moffat

Applications Scientist
Oxford Instruments Asylum Research, United Kingdom

Dr Jonathan Moffat is an applications scientist for Oxford Instruments Asylum Research. Jonathan is a specialist in atomic force microscopy (AFM) and has been using the technique since 2006. His research background is in using thermal probe AFM methods and combining these with infrared spectroscopy. He joined Oxford Instruments in 2013 and provides applications, sales and customer support for the northern Europe region.

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Presentation(s):