Jan Dewanckele

Head of application micro-CT
TESCAN XRE, United States

Disclosure information not submitted.

Presentation(s):

• Dynamic CT Imaging in the Laboratory: Characterization of Pore Filling Events in Geological Materials

  Tuesday, July 25, 2023
  9:30 AM – 9:45 AM US CST

• Development of a multi-scale imaging and analysis workflow for batteries: from cell level to electrode particle porosity.

  Wednesday, July 26, 2023
  11:45 AM – 12:00 PM US CST

• Spectral CT in the World of Electronics: Moving Toward Failure Free Devices

  Thursday, July 27, 2023
  2:30 PM – 2:45 PM US CST