Torsten Richter

Product Manager
Raith GmbH, Germany

Disclosure information not submitted.

Presentation(s):

• GaBiLi - A novel Focused Ion Beam (FIB) source for ion microscopy and related workflows for 3D tomography with a top-down FIB from Liquid Metal Alloy Ion Sources (LMAIS).

  Tuesday, July 25, 2023
  11:45 AM – 12:00 PM US CST