Senior R&D Scientist
IONTOF GmbH
Muenster, Nordrhein-Westfalen, Germany
Since 2001 employed at IONTOF Technologies GmbH as senior research scientist. Development of significant advancements related to TOF-SIMS analytical instrumentation, specifically Bi and BiMn cluster ion sources, and analytical improvements in spectrometer technology, and high spatial resolution imaging.
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CANCELLED: Hybrid SIMS: Secondary Ion Mass Spectrometry Imaging with High Mass Resolving Power
Monday, July 24, 2023
2:30 PM – 3:00 PM US CST