Kaijun Yin

University of Illinois at Urbana-Champaign, Illinois, United States

Disclosure information not submitted.

Presentation(s):

• Extending 4D-STEM to Defect and Short-Range Ordering Analysis: Principles, Methodology and Applications

  Monday, July 24, 2023
  1:30 PM – 2:00 PM US CST

• Deformation Defects Characterization in Short-Range Ordered CrCoNi using Fast Electron Detectors and 4D-STEM

  Monday, July 24, 2023
  2:00 PM – 2:15 PM US CST

• 4D-STEM Diffuse Scattering Characterization for Detection of Short-Range Ordering – A New Procedure for Pattern and Spatial Distribution Visualization

  Thursday, July 27, 2023
  9:15 AM – 9:30 AM US CST