Robert Busch

Univ of Illinois, United States

Disclosure information not submitted.

Presentation(s):

• Extending 4D-STEM to Defect and Short-Range Ordering Analysis: Principles, Methodology and Applications

  Monday, July 24, 2023
  1:30 PM – 2:00 PM US CST

• Atomic Resolution Tomography on Simulated Amorphous Silicon Nanoparticles

  Monday, July 24, 2023
  2:30 PM – 2:45 PM US CST

• Combined 4D-STEM and EELS for Mapping Chemical-Structural Heterogeneity in Cathode Materials

  Tuesday, July 25, 2023
  9:45 AM – 10:00 AM US CST

• Electron Microscopy of Electrochemical Degradation in Energy Materials across Multiple Length Scales: Challenges and Opportunities

  Wednesday, July 26, 2023
  10:30 AM – 11:00 AM US CST