President
Nion Co.
Department of Physics, Arizona State University, Tempe AZ 85287, USA
Sammamish, Washington, United States
Ondrej L. Krivanek was born in Prague, Czech Republic. After completing his primary and secondary education there, he moved to the UK, where he obtained a BSc in Physics at the University of Leeds, and a PhD in solid state physics at the University of Cambridge.
After post-doc appointments at Kyoto University in Japan, Bell Labs and UC Berkeley, he became an assistant professor and associate director of the NSF HREM Facility at Arizona State University. In 1985 he become the Director of R&D at Gatan in Pleasanton CA, where he and his team developed a number of products such as Electron Energy Loss Spectrometers and Imaging Filters, Slow Scan CCD cameras, and Digital Micrograph software.
He is currently the President of Nion Co., which he founded with Niklas Dellby in 1997, to develop aberration correctors for electron lenses, and other products for Electron Microscopy. Nion delivered the first commercial electron lens aberration corrector in the world in 2000, and went on to design and build Scanning Transmission Electron Microscopes (STEMs) that operate with ultra high vacuum at the sample, achieve 1 Å resolution at 30 keV, and an energy resolution <3 meV in Electron Energy Loss Spectroscopy (EELS).
Ondrej’s work in electron microscopy has brought him several awards, including the Kavli Prize for Nanoscience (2020), the Cosslett Medal of IFMS (2014), and the Duddell Medal and Prize of the Institute of Physics (2000). He is a fellow of the Royal Society, the Institute of Physics, the Microscopy Society of America, and of the American Physical Society, and an honorary fellow of the Royal Microscopical Society and Robinson College in Cambridge.
Disclosure information not submitted.
Ultra-High Resolution EELS Analysis and STEM Imaging at 20 keV
Tuesday, July 25, 2023
9:15 AM – 9:30 AM US CST
Atomic Resolution SE Imaging in a 30-200 keV Aberration-Corrected UHV STEM
Tuesday, July 25, 2023
8:45 AM – 9:00 AM US CST
Mapping Phonon Dispersion Surfaces at Nanometer Scale
Wednesday, July 26, 2023
11:15 AM – 11:30 AM US CST
Data Acquisition and Control of Electron Microscopes
Wednesday, July 26, 2023
1:30 PM – 2:00 PM US CST
Ultra-High Energy Resolution EELS and 4D STEM at Cryogenic Temperatures
Thursday, July 27, 2023
9:15 AM – 9:30 AM US CST