NIST Fellow
National Institute of Standards and Technology
Gaithersburg, Maryland, United States
Dale E. Newbury
NIST Fellow
Materials Measurement Science Division
National Institute of Standards and Technology
Gaithersburg, MD 20899
301-975-3921
301-655-5128 (cell)
dale.newbury@nist.gov
Education:
1972: Doctor of Philosophy, Metallurgy and Materials Science, Oxford University, United Kingdom
1969-1972: Marshall Scholarship, awarded by the Parliament of the United Kingdom for study at Oxford University
1969: B. S.(summa cum laude, with Departmental and Interdepartmental Honors), Metallurgy and Materials Science, Lehigh University
PROFESSIONAL EXPERIENCE
NIST Fellow, 1994 - present, Materials Measurement Science Division
Group Leader, Microanalysis Research Group, NIST, 1979 - 1994.
Research staff member, Microanalysis Research Group, NBS, 1973-1979.
National Research Council Postdoctoral Fellow, Metallurgy Division, NBS, 1972-1973
Research interests
Electron probe X-ray microanalysis, scanning electron microscopy, energy dispersive X-ray spectrometry, Monte Carlo electron trajectory simulation, computer-aided analysis, computer-aided imaging; advanced materials characterization (e. g., nanomaterials; coatings); failure analysis; composite materials; more than 400 publications to date; co-author of six books; editor of five books; author of nine book chapters; editorial boards of Microscopy and Microanalysis; J. Microscopy
Honors:
Elected Fellow, Microanalysis Society, 2018
Abbe Award, New York Microscopical Society, 2010
Gold Medal Award, Department of Commerce, 2010
Duncumb Award for Excellence in Microanalysis, MAS, 2009
Elected Fellow, Microscopy Society of America, 2009
Outstanding Technical Paper Award, Electronics and Electrical Engineering Laboratory, NIST, 1998
Samuel Wesley Stratton Award for outstanding research achievement NIST, 1994
Microbeam Analysis Society, Presidential Award for Scientific Achievement, 1993
Edward Uhler Condon Award for distinguished written exposition, NIST, 1991
Birks Award, MAS, 1990
Macres Award, MAS, 1988
Industrial Research 100 Award, 1987 “Compositional Mapping”
Gold Medal Award, Department of Commerce, 1986
Arthur S. Flemming Award (Washington Jaycees), 1986
Microbeam Analysis Society, Presidential Award for Service, 1983
Silver Medal Award, Department of Commerce, 1981
Bronze Medal Award, Department of Commerce, 1980
Hardy Gold Medal, Metallurgical Society, AIME, 1972
Disclosure information not submitted.
David Joy’s Role in Physical Data and Models for Microanalysis
Tuesday, July 25, 2023
2:00 PM – 2:30 PM US CST
Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!
Wednesday, July 26, 2023
9:30 AM – 9:45 AM US CST