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Albuquerque, New Mexico, United States
Joe Michael recently retired after 32 years as a Senior Scientist in the Material, Physical and Chemical Sciences Center at Sandia National Laboratories in Albuquerque, New Mexico. Previously, he was employed as a Senior Research Engineer at Bethlehem Steel’s Homer Research Laboratory. He received his BS, MS and PhD degrees in Materials Science and Engineering from Lehigh University in Bethlehem, Pennsylvania. Dr. Michael has spent his career developing and applying electron and ion microscopy techniques for materials characterization. He holds several patents in the area of materials and materials characterization techniques and has published over 200 papers in this area. He is also a co-author of the leading textbook on scanning electron microscopy. Dr. Michael has received many awards and honors including the Burton Medal from the Microscopy Society of America, from the Microbeam Analysis Society he has received the Heinrich Award, the Duncumb Award and the Presidential Science Award. The International Center for Diffraction Data awarded him the Hanawalt Award for developments in the area of phase identification using electron beams. He is a Fellow of the Microscopy Society of America and the Microanalysis Society. Joe currently serves as an Editor of Microscopy and Microanalysis.
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How Did Low Voltage in the SEM Become the Preferred Route to High Resolution Imaging?
Tuesday, July 25, 2023
10:30 AM – 11:00 AM US CST