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Cecile Bonifacio (she/her/hers)

Senior Applications Scientist
E. A. Fischione Instruments, Inc., United States

Cecile Bonifacio has more than 17 years of experience in electron microscopy sample preparation, imaging, and analysis. Over this time period, she has authored/co-authored more than 50 publications, given presentations at various meetings and taught in Lehigh University’s Microscopy course. Cecile spent the first 3 years of her career studying electron microscopy at San Joaquin Delta College and later pursued her advanced degrees in chemical engineering; M.S. at San Jose State University and PhD at UC Davis. Cecile gained expertise in TEM, STEM and in situ microscopy during her doctoral studies and successively in her post-doctoral work at University of Pittsburgh. Cecile joined Fischione Instruments as an applications scientist in 2016. Cecile is currently a Senior Applications Scientist for TEM applications.

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Presentation(s):

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