Research Chemist / NRC Postdoc.
National Institute of Standards and Technology
Germantown, Maryland, United States
A native of the Lehigh Valley in Pennsylvania, Devon S. Jakob obtained his PhD in chemistry at Lehigh University in 2021 under the supervision of Prof. Xiaoji G. Xu. In the same year, he joined Dr. Andrea Centrone's group at the National Institute of Standards and Technology through the NIST Professional Research Experience Program with Georgetown University. His expertise is in the development of novel atomic force microscopy techniques for improved imaging capabilities and spatial resolution. He enjoys identifying current and future questions regarding material development and commercialization and developing novel microscopy platforms to address them. Devon is the co-inventor of pulsed force Kelvin probe force microscopy (PF-KPFM) and has also worked extensively with several AFM-based chemical mapping techniques such as peak force infrared (PFIR) microscopy, photothermal induced resonance (PTIR) microscopy, and photoinduced force microscopy (PiFM). Devon's most recent accomplishment is the extension of NIST's top-down illumination PTIR setup to the visible and near-infrared spectral ranges.
Disclosure information not submitted.
Visible to Mid-IR Spectromicroscopy with Top-Down Illumination and Nanoscale (≈ 10 nm) Resolution
Wednesday, July 26, 2023
9:15 AM – 9:30 AM US CST