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Atomic Resolution SE Imaging in a 30-200 keV Aberration-Corrected UHV STEM

Presenting Author(s)

• 

  Ondrej L. Krivanek

  President
  Nion Co.
  Department of Physics, Arizona State University, Tempe AZ 85287, USA
  Sammamish, Washington, United States

Co-Author(s)

• MH

  Michael T. Hotz (he/him/his)

  Nion Co., United States
• JM

  Joel Martis

  Stanford University, United States
• TR

  Tomas Radlicka

  Institute of Scientific Instruments, Brno, Czech Republic, United States
• NB

  Neil Bacon

  Nion Co., United States
• ND

  Niklas Dellby

  CTO
  Nion Co.
  Kirkland, Washington, United States
• HH

  Harold Y. Hwang

  Professor
  Stanford University, United States
• TL

  Tracy Lovejoy

  CEO
  Nion Co.
  Kirkland, Washington, United States
• SQ

  Steven Quillin

  Nion Co., United States
• PS

  Prastuti Singh

  Stanford University, United States