Featured Symposium

Measuring 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography

Presenting Author(s)

• 

  Jonathan Schwartz

  Graduate Student
  University of Michigan, Ann Arbor
  University of Michigan, United States

Co-Author(s)

• ZD

  Zichao Wendy Di, Ph.D.

  Assistant Computational Scientist
  Mathematics and Computer Science Division, Argonne National Laboratory, United States
• YJ

  Yi Jiang, Ph.D.

  Beamline Data Scientist
  Advanced Photon Source, Argonne National Laboratory
  Argonne National Laboratory, United States
• YQ

  Yiwen Qian

  Department of Materials Science and Engineering, University of California at Berkeley, United States
• JG

  Junsi Gu

  Dow Chemical Co., United States
• SR

  Steve Rozeveld

  Scientist
  Dow Chemical Co., United States
• 

  Peter Ercius, PhD (he/him/his)

  Staff Scientist
  Lawrence Berkeley National Laboratory
  Berkeley, California, United States
• JF

  Jeffrey A. Fessler

  Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, United States
• TX

  Ting Xu

  Department of Materials Science and Engineering, University of California at Berkeley
  (1) Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, United States
• MS

  Mary Scott, Ph.D.

  Assistant Professor
  University of California - Berkeley
  (1) Lawrence Berkeley National Laboratory
  Berkeley, California, United States