Featured Symposium

Deep Learning for Automated Quantification of Irradiation Defects in TEM Data: Relating Pixel-level Errors to Defect Properties

Presenting Author(s)

• RS

  Rajat Sainju

  Research Assistant
  University of Connecticut
  University of Connecticut, United States

Co-Author(s)

• GR

  Graham Roberts

  graduate student
  University of Connecticut, United States
• BH

  Brian Hutchinson

  Western Washington University, United States
• WC

  Wei-Ying Chen

  Scientist
  Argonne National Laboratory
  Argonne National Laboratory, United States
• QY

  Qian Yang

  University of Connecticut, United States
• CD

  Caiwen Ding

  Assistant Professor
  University of Connecticut, United States
• ML

  Meimei Li

  scientist
  Argonne National Laboratory, United States
• 

  Yuanyuan Zhu

  Assistant Professor
  University of Connecticut
  University of Connecticut
  Storrs, Connecticut, United States