Featured Symposium

U-Net Implementation for High Throughput Grain Boundary Detection in Bright Field TEM Micrographs: Toward in situ Grain Growth Studies

Presenting Author(s)

• MP

  Matthew J. Patrick (he/him/his)

  Department of Applied Physics and Applied Mathematics, Columbia University, United States

Co-Author(s)

• JE

  James K. Eckstein

  Department of Physics, University of Illinois-- Urbana Champaign, United States
• JL

  Javier Lopez

  Department of Mechanical Engineering, Columbia University, United States
• ST

  Silvia Toderas

  Department of Applied Physics and Applied Mathematics, Columbia University, United States
• AM

  Alan J. Ma

  Department of Mathematics, Columbia University, United States
• SL

  Stacey Levine, Ph.D.

  Department of Matematics and Computer Science, Duquesne University, United States
• KB

  Katayun Barmak, Ph.D.

  Department of Applied Physics and Applied Mathematics, Columbia University
  New York, New York, United States