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ViewAttendees 5

Featured Symposium

Analytical Sciences Symposia

Secondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials

Tuesday, July 25, 2023
11:30 AM – 11:45 AM US CST
Location: 200C

    Presenting Author(s)

  • Sooyeon Hwang

    Staff Scientist
    Brookhaven National Laboratory, New York, United States