PMC X61 - Advances in Focused Ion Beam Technologies

**Organized by the MS AFIB Focused Interest Group**

AM Coffee Breaks and Lunch is provided during this session.

Advances in focused ion beam technologies have created new opportunities in microscopy, microanalysis, materials/bio-engineering and nano-fabrication. This workshop aims to introduce the emerging technologies and applications in the field of focused ion beams, including SIMS, liquid metal alloy ion sources, plasma- as well as gas field ion sources and cold beams. The PMC will motivate how these emerging technologies and approaches extend the traditional Ga LMIS FIB technology and application space. The different technologies and applications will be explained by experts in the field including John Notte, Dean Miller, Rick Passey, William Rickard and Edward Bielejec.
• Advances in FIB technology
• Ga- VS GFIS- VS plasma- VS LMAIS sources
• SIMS
• Technology and application space for different systems