X32 - Technologists' Forum Symposium – 4D STEM Tips and Techniques [Partnering with A04]

Speakers:

• Tina Bergh, NTNU [Scanning Electron Diffraction: To Precess or not to Precess?]


• Yu-Tsun Shao, USC [Principles and Applications of 4D-STEM Diffraction Imaging for Characterizing Complex Crystalline Materials]


• Steven Zeltmann, Cornell [Choosing Detectors and Analysis Software for 4D-STEM]

ORGANIZERS:
John L. Grazul, Cornell University
D. Page Baluch, Arizona State University

4D-STEM has advanced the study of materials at a variety of length scales, from the highest-resolution imaging to millimeter-scale mapping of structures and properties. Recent development of novel 4D-STEM techniques further expands our capability to study beam-sensitive samples, and improvement in saturation current and detector speeds allows for in-situ experiments. This symposium covers the latest applications of 4D-STEM in the study of biological and functional materials, developments of new data analysis methods and best practices to further advance quantitative and multiscale characterization. This year the Technologists' Forum is partnering with the organizers of the Praxis 4D-STEM symposium [A04] to provide a series of presentations that will review the most common protocols used in 4D-STEM.

• New applications of 4D-STEM to structural biology and soft matter structure-property measurements.


• Experiments which map fields, phase, structural distortions, orientation, and other sample properties on many length scales.


• Dose-efficient imaging techniques such as phase contrast methods or multimodal data synthesis.