X40 - Need for Speed: Imaging Biological Samples with the 64-Beams FAST-EM

Speakers: Jacob Hoogenboom Group, Delft University of Technology, The Netherlands

Large scale and volume electron microscopy (EM) has revolutionized the understanding of biological systems across different spatial scales, but the low throughput of EM limits further progress. In this tutorial, we will illustrate the working principles behind the FAST-EM, a novel multibeam scanning electron microscope with a footprint similar to regular single-beam SEMs. We will present results of faster imaging with FAST-EM and discuss sample preparation, imaging parameters, detection techniques, image post-processing and data analysis.