Featured Symposium

Measuring single atomic defects in 2D materials with off-axis EELS using real-time AI-driven detection

Presenting Author(s)

• 

  Kevin M. Roccapriore

  R&D Associate
  Oak Ridge National Laboratory
  Oak Ridge, Tennessee, United States

Co-Author(s)

• MZ

  Maxim Ziatdinov

  Oak Ridge National Lab, United States
• RT

  Riccardo Torsi

  Penn State University, United States
• JR

  Joshua Robinson

  Penn State University
  State College, Pennsylvania, United States
• SK

  Sergei V. Kalinin

  University of Tennessee, United States