Featured Symposium

Multimodal Analysis of InAs/InGaAlAs Quantum Dots Using Transmission Electron Microscopy and Atom Probe Tomography

Presenting Author(s)

• YY

  Yudai Yamaguchi (he/him/his)

  Sony Semiconductor Solutions Corporation
  Atsugi, Kanagawa, Japan

Co-Author(s)

• YK

  Yuya Kanitani

  Sony Semiconductor Solutions Corporation, Japan
• MS

  Michinori Shiomi

  Sony Semiconductor Solutions Corporation, Japan
• MY

  Mikihiro Yokozeki

  Sony Semiconductor Solutions Corporation, Japan
• JU

  Jun Uzuhashi

  National Institute for Materials Science, United States
• TO

  Tadakatsu Ohkubo

  National Institute for Materials Science, Japan
• KH

  Kazuhiro Hono

  National Institute for Materials Science, Japan
• KA

  Kouichi Akahane

  National Institute of Information and Communications Technology, Japan
• NY

  Naokatsu Yamamoto

  National Institute of Information and Communications Technology, Japan
• ST

  Shigetaka Tomiya

  Sony Semiconductor Solutions Corporation, Japan