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Featured Symposium

Analytical Sciences Symposia

Artifact-free preparation of plan view TEM specimens and its application to MRAM devices

Tuesday, July 25, 2023
2:00 PM – 2:15 PM US CST
Location: 200A

    Presenting Author(s)

  • Cecile Bonifacio (she/her/hers)

    Senior Applications Scientist
    E. A. Fischione Instruments, Inc., United States

    • Co-Author(s)

  • RL

    Richard Li (he/him/his)

    Sales/Service Manager for Taiwan
    E.A. Fischione Instruments Inc, United States

  • PN

    Pawel Nowakowski

    Senior Scientist
    E. A. Fischione Instruments, Inc., Pennsylvania, United States

  • MR

    Mary Ray

    Marketing and Communications Manager
    E. A. Fischione Instruments, Inc., United States

  • PF

    Paul Fischione

    CEO
    E. A. Fischione Instruments, Inc., United States