Featured Symposium

Wide Field of View versus High Spatial Resolution and High Sensitivity – the Advantage of Correlative Microscopies (APT, SIMS, EBSD, XRF) for the Analysis of Minerals

Presenting Author(s)

• RU

  Robert Ulfig

  Sr. Product Manager
  CAMECA Instruments Inc.
  Madison, Wisconsin, United States

Co-Author(s)

• SR

  Steven Reddy

  School of Earth and Planetary Sciences, Curtin University, Australia
• DS

  David Saxey

  John de Laeter Centre, Curtin University, Australia
• 

  William Rickard

  Deputy Director
  John de Laeter Centre, Curtin university
  Curtin university
  Bentley, Western Australia, Australia
• DF

  Denis Fougerouse (he/him/his)

  Geoscience Atom Probe Facility, John de Laeter Centre, School of Earth and Planetary Sciences, Curtin University, United States
• MP

  Mark Pearce

  Research Group Leader
  CSIRO
  Kensington, Western Australia, United States
• LF

  Louise Fisher

  CSIRO, United States
• MK

  Matt Kilburn

  University of Western Australia, United States
• DR

  David Reinhard

  Product Manager
  CAMECA Instruments Inc.
  Madison, Wisconsin, United States
• DL

  David J. Larson

  Dir. Scientific Marketing
  CAMECA Instruments Inc.
  Madison, Wisconsin, United States