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ViewAttendees 5

Featured Symposium

Analytical Sciences Symposia

Deformation Defects Characterization in Short-Range Ordered CrCoNi using Fast Electron Detectors and 4D-STEM

Monday, July 24, 2023
2:00 PM – 2:15 PM US CST
Location: 200B

    Presenting Author(s)

  • KY

    Kaijun Yin

    University of Illinois at Urbana-Champaign, Illinois, United States

    • Co-Author(s)

  • Haw-Wen Hsiao

    Post Doctoral Researcher
    Univ of Illinois
    University of Illinois Urbana-Champaign
    Urbana, Illinois, United States

  • RF

    Rui Feng

    The University of Tennessee Knoxville, United States

  • PL

    Peter K. Liaw

    The University of Tennessee Knoxville, United States

  • Jian-Min Zuo, Ph.D (he/him/his)

    Professor
    University of Illinois, Urbana-Champaign
    Arizona State University
    Urbana, Illinois, United States