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Analytical Sciences Symposia

Category: Featured Symposium

A08.P1 - Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences

(129) 10 years of LaserFIB: The Latest Developments in a Dual Chamber, 3 Beam FIB-SEM for Large Volume Material Removal and Semi-Automated FIB Integration

Tuesday, July 25, 2023

3:00 PM – 5:00 PM US CST

Location: Exhibit Hall

Presenting Author(s)

Benjamin Tordoff, Dr. (he/him/his)

Head of Materials Science Business Sector
Carl Zeiss Microscopy GmbH
Oberkochen, Baden-Wurttemberg, Germany

Cheryl Hartfield

ZEISS, United States
SK

Sebastian Krauss (he/him/his)

Applications Development Engineer
ZEISS
Oberkochen, Baden-Wurttemberg, Germany
LA

Lamya Abdellaoui

ZEISS, United States
Stephen Kelly

Energy Materials Solutions Manager
Carl Zeiss
Dublin, California, United States
HB

Hrishikesh Bale

Solutions Manager-Engineering Materials
ZEISS Research Microscopy Solutions
Dublin, California, United States